Online dynamic flat-field correction for MHz microscopy data at European XFEL

open access.

Bibliographische Detailangaben
Veröffentlicht in:Journal of synchrotron radiation. - 1994. - 30(2023), Pt 6 vom: 01. Nov., Seite 1030-1037
1. Verfasser: Birnsteinova, Sarlota (VerfasserIn)
Weitere Verfasser: Ferreira de Lima, Danilo E, Sobolev, Egor, Kirkwood, Henry J, Bellucci, Valerio, Bean, Richard J, Kim, Chan, Koliyadu, Jayanath C P, Sato, Tokushi, Dall'Antonia, Fabio, Asimakopoulou, Eleni Myrto, Yao, Zisheng, Buakor, Khachiwan, Zhang, Yuhe, Meents, Alke, Chapman, Henry N, Mancuso, Adrian P, Villanueva-Perez, Pablo, Vagovič, Patrik
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2023
Zugriff auf das übergeordnete Werk:Journal of synchrotron radiation
Schlagworte:Journal Article MHz X-ray microscopy X-ray free-electron laser flat-field correction online data processing
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520 |a The high pulse intensity and repetition rate of the European X-ray Free-Electron Laser (EuXFEL) provide superior temporal resolution compared with other X-ray sources. In combination with MHz X-ray microscopy techniques, it offers a unique opportunity to achieve superior contrast and spatial resolution in applications demanding high temporal resolution. In both live visualization and offline data analysis for microscopy experiments, baseline normalization is essential for further processing steps such as phase retrieval and modal decomposition. In addition, access to normalized projections during data acquisition can play an important role in decision-making and improve the quality of the data. However, the stochastic nature of X-ray free-electron laser sources hinders the use of standard flat-field normalization methods during MHz X-ray microscopy experiments. Here, an online (i.e. near real-time) dynamic flat-field correction method based on principal component analysis of dynamically evolving flat-field images is presented. The method is used for the normalization of individual X-ray projections and has been implemented as a near real-time analysis tool at the Single Particles, Clusters, and Biomolecules and Serial Femtosecond Crystallography (SPB/SFX) instrument of EuXFEL 
650 4 |a Journal Article 
650 4 |a MHz X-ray microscopy 
650 4 |a X-ray free-electron laser 
650 4 |a flat-field correction 
650 4 |a online data processing 
700 1 |a Ferreira de Lima, Danilo E  |e verfasserin  |4 aut 
700 1 |a Sobolev, Egor  |e verfasserin  |4 aut 
700 1 |a Kirkwood, Henry J  |e verfasserin  |4 aut 
700 1 |a Bellucci, Valerio  |e verfasserin  |4 aut 
700 1 |a Bean, Richard J  |e verfasserin  |4 aut 
700 1 |a Kim, Chan  |e verfasserin  |4 aut 
700 1 |a Koliyadu, Jayanath C P  |e verfasserin  |4 aut 
700 1 |a Sato, Tokushi  |e verfasserin  |4 aut 
700 1 |a Dall'Antonia, Fabio  |e verfasserin  |4 aut 
700 1 |a Asimakopoulou, Eleni Myrto  |e verfasserin  |4 aut 
700 1 |a Yao, Zisheng  |e verfasserin  |4 aut 
700 1 |a Buakor, Khachiwan  |e verfasserin  |4 aut 
700 1 |a Zhang, Yuhe  |e verfasserin  |4 aut 
700 1 |a Meents, Alke  |e verfasserin  |4 aut 
700 1 |a Chapman, Henry N  |e verfasserin  |4 aut 
700 1 |a Mancuso, Adrian P  |e verfasserin  |4 aut 
700 1 |a Villanueva-Perez, Pablo  |e verfasserin  |4 aut 
700 1 |a Vagovič, Patrik  |e verfasserin  |4 aut 
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