Yao, R., Du, S., Cui, W., Ye, A., Wen, F., Zhang, H., . . . Gao, Y. (2023). Hunter: Exploring High-Order Consistency for Point Cloud Registration With Severe Outliers. IEEE transactions on pattern analysis and machine intelligence, 45(12), 14760. https://doi.org/10.1109/TPAMI.2023.3312592
Style de citation ChicagoYao, Runzhao, Shaoyi Du, Wenting Cui, Aixue Ye, Feng Wen, Hongbo Zhang, Zhiqiang Tian, et Yue Gao. "Hunter: Exploring High-Order Consistency for Point Cloud Registration With Severe Outliers." IEEE Transactions on Pattern Analysis and Machine Intelligence 45, no. 12 (2023): 14760. https://dx.doi.org/10.1109/TPAMI.2023.3312592.
Style de citation MLAYao, Runzhao, et al. "Hunter: Exploring High-Order Consistency for Point Cloud Registration With Severe Outliers." IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 45, no. 12, 2023, p. 14760.