Small-angle X-ray scattering in the era of fourth-generation light sources

© Theyencheri Narayanan et al. 2023.

Détails bibliographiques
Publié dans:Journal of applied crystallography. - 1998. - 56(2023), Pt 4 vom: 01. Aug., Seite 939-946
Auteur principal: Narayanan, Theyencheri (Auteur)
Autres auteurs: Chèvremont, William, Zinn, Thomas
Format: Article en ligne
Langue:English
Publié: 2023
Accès à la collection:Journal of applied crystallography
Sujets:Journal Article X-ray photon correlation spectroscopy active colloids fourth-generation synchrotrons radiation damage small-angle X-ray scattering soft matter systems ultra-small-angle X-ray scattering
Description
Résumé:© Theyencheri Narayanan et al. 2023.
Recently, fourth-generation synchrotron sources with several orders of magnitude higher brightness and higher degree of coherence compared with third-generation sources have come into operation. These new X-ray sources offer exciting opportunities for the investigation of soft matter and biological specimens by small-angle X-ray scattering (SAXS) and related scattering methods. The improved beam properties together with the advanced pixel array detectors readily enhance the angular resolution of SAXS and ultra-small-angle X-ray scattering in the pinhole collimation. The high degree of coherence is a major boost for the X-ray photon correlation spectroscopy (XPCS) technique, enabling the equilibrium dynamics to be probed over broader time and length scales. This article presents some representative examples illustrating the performance of SAXS and XPCS with the Extremely Brilliant Source at the European Synchrotron Radiation Facility. The rapid onset of radiation damage is a significant challenge with the vast majority of samples, and appropriate protocols need to be adopted for circumventing this problem
Description:Date Revised 10.08.2023
published: Electronic-eCollection
Citation Status PubMed-not-MEDLINE
ISSN:0021-8898
DOI:10.1107/S1600576723004971