Small-angle X-ray scattering in the era of fourth-generation light sources

© Theyencheri Narayanan et al. 2023.

Bibliographische Detailangaben
Veröffentlicht in:Journal of applied crystallography. - 1998. - 56(2023), Pt 4 vom: 01. Aug., Seite 939-946
1. Verfasser: Narayanan, Theyencheri (VerfasserIn)
Weitere Verfasser: Chèvremont, William, Zinn, Thomas
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2023
Zugriff auf das übergeordnete Werk:Journal of applied crystallography
Schlagworte:Journal Article X-ray photon correlation spectroscopy active colloids fourth-generation synchrotrons radiation damage small-angle X-ray scattering soft matter systems ultra-small-angle X-ray scattering
Beschreibung
Zusammenfassung:© Theyencheri Narayanan et al. 2023.
Recently, fourth-generation synchrotron sources with several orders of magnitude higher brightness and higher degree of coherence compared with third-generation sources have come into operation. These new X-ray sources offer exciting opportunities for the investigation of soft matter and biological specimens by small-angle X-ray scattering (SAXS) and related scattering methods. The improved beam properties together with the advanced pixel array detectors readily enhance the angular resolution of SAXS and ultra-small-angle X-ray scattering in the pinhole collimation. The high degree of coherence is a major boost for the X-ray photon correlation spectroscopy (XPCS) technique, enabling the equilibrium dynamics to be probed over broader time and length scales. This article presents some representative examples illustrating the performance of SAXS and XPCS with the Extremely Brilliant Source at the European Synchrotron Radiation Facility. The rapid onset of radiation damage is a significant challenge with the vast majority of samples, and appropriate protocols need to be adopted for circumventing this problem
Beschreibung:Date Revised 10.08.2023
published: Electronic-eCollection
Citation Status PubMed-not-MEDLINE
ISSN:0021-8898
DOI:10.1107/S1600576723004971