Sensitivity of Puccinia triticina f. sp. tritici from China to Triadimefon and Resistance Risk Assessment
Wheat leaf rust, caused by Puccinia triticina f. sp. tritici (Pt), is distributed widely in wheat-producing areas and results in serious yield losses worldwide. In China, leaf rust has been largely controlled with a demethylation inhibitor (DMI) fungicide, triadimefon. Although high levels of fungic...
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Bibliographische Detailangaben
| Veröffentlicht in: | Plant disease. - 1997. - 107(2023), 12 vom: 01. Dez., Seite 3877-3885
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| 1. Verfasser: |
Ji, Fan
(VerfasserIn) |
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| Weitere Verfasser: |
Zhou, Aihong,
Liu, Bofan,
Liu, Yue,
Feng, Yaoxuan,
Wang, Xiaodong,
Huang, Lili,
Kang, Zhensheng,
Zhan, Gangming |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2023
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| Zugriff auf das übergeordnete Werk: | Plant disease
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| Schlagworte: | Journal Article
fungicide sensitivity
triadimefon
wheat leaf rust
1HW039CJF0
Fungicides, Industrial |
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