Effects of the Grazing Incidence Geometry on X-ray Photon Correlation Spectroscopy Measurements
X-ray photon correlation spectroscopy (XPCS) is a versatile tool to measure dynamics on the nanometer to micrometer scale in bulk samples. XPCS has also been applied in grazing incidence (GI) geometry to examine the dynamics of surface layers. However, considering GI scattering experiments more univ...
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| Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1985. - 39(2023), 23 vom: 13. Juni, Seite 8215-8223
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| 1. Verfasser: |
Greve, Christopher R
(VerfasserIn) |
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| Weitere Verfasser: |
Kuhn, Meike,
Eller, Fabian,
Buchhorn, Michael A,
Hexemer, Alexander,
Freychet, Guillaume,
Wiegart, Lutz,
Herzig, Eva M |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2023
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| Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids
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| Schlagworte: | Journal Article |
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