Full-field hard X-ray nano-tomography at SSRF
open access.
| Publié dans: | Journal of synchrotron radiation. - 1994. - 30(2023), Pt 4 vom: 01. Juli, Seite 815-821 |
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| Auteur principal: | |
| Autres auteurs: | , , , , , , |
| Format: | Article en ligne |
| Langue: | English |
| Publié: |
2023
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| Accès à la collection: | Journal of synchrotron radiation |
| Sujets: | Journal Article X-ray nano-imaging ellipsoidal capillary spatial resolution synchrotron radiation facility Silicon Dioxide 7631-86-9 |
| Résumé: | open access. An in-house designed transmission X-ray microscopy (TXM) instrument has been developed and commissioned at beamline BL18B of the Shanghai Synchrotron Radiation Facility (SSRF). BL18B is a hard (5-14 keV) X-ray bending-magnet beamline recently built with sub-20 nm spatial resolution in TXM. There are two kinds of resolution mode: one based on using a high-resolution-based scintillator-lens-coupled camera, and the other on using a medium-resolution-based X-ray sCMOS camera. Here, a demonstration of full-field hard X-ray nano-tomography for high-Z material samples (e.g. Au particles, battery particles) and low-Z material samples (e.g. SiO2 powders) is presented for both resolution modes. Sub-50 nm to 100 nm resolution in three dimensions (3D) has been achieved. These results represent the ability of 3D non-destructive characterization with nano-scale spatial resolution for scientific applications in many research fields |
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| Description: | Date Completed 10.07.2023 Date Revised 18.07.2023 published: Print-Electronic Citation Status PubMed-not-MEDLINE |
| ISSN: | 1600-5775 |
| DOI: | 10.1107/S1600577523003168 |