Kaganer, V. M., Konovalov, O. V., Calabrese, G., van Treeck, D., Kwasniewski, A., Richter, C., . . . Brandt, O. (2023). X-ray scattering study of GaN nanowires grown on Ti/Al2O3 by molecular beam epitaxy. Journal of applied crystallography, 56(Pt 2), 439. https://doi.org/10.1107/S1600576723001486
Chicago ZitierstilKaganer, Vladimir M., Oleg V. Konovalov, Gabriele Calabrese, David van Treeck, Albert Kwasniewski, Carsten Richter, Sergio Fernández-Garrido, und Oliver Brandt. "X-ray Scattering Study of GaN Nanowires Grown on Ti/Al2O3 by Molecular Beam Epitaxy." Journal of Applied Crystallography 56, no. Pt 2 (2023): 439. https://dx.doi.org/10.1107/S1600576723001486.
MLA ZitierstilKaganer, Vladimir M., et al. "X-ray Scattering Study of GaN Nanowires Grown on Ti/Al2O3 by Molecular Beam Epitaxy." Journal of Applied Crystallography, vol. 56, no. Pt 2, 2023, p. 439.