Adaptive Hierarchical Similarity Metric Learning With Noisy Labels
Deep Metric Learning (DML) plays a critical role in various machine learning tasks. However, most existing deep metric learning methods with binary similarity are sensitive to noisy labels, which are widely present in real-world data. Since these noisy labels often cause a severe performance degrada...
| Veröffentlicht in: | IEEE transactions on image processing : a publication of the IEEE Signal Processing Society. - 1992. - 32(2023) vom: 01., Seite 1245-1256 |
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| Format: | Online-Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2023
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| Zugriff auf das übergeordnete Werk: | IEEE transactions on image processing : a publication of the IEEE Signal Processing Society |
| Schlagworte: | Journal Article |
| Online verfügbar |
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