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|a 10.1002/adma.202211207
|2 doi
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|a pubmed24n1176.xml
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|a (DE-627)NLM352898607
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|a (NLM)36780501
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|a DE-627
|b ger
|c DE-627
|e rakwb
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|a eng
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|a Yang, Chen-Quan
|e verfasserin
|4 aut
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|a Unveiling the Intrinsic Structure and Intragrain Defects of Organic-Inorganic Hybrid Perovskites by Ultralow Dose Transmission Electron Microscopy
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|c 2023
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|a Text
|b txt
|2 rdacontent
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|a ƒaComputermedien
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|2 rdamedia
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|a ƒa Online-Ressource
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|2 rdacarrier
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|a Date Completed 16.05.2023
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|a Date Revised 16.05.2023
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|a published: Print-Electronic
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|a Citation Status PubMed-not-MEDLINE
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|a © 2023 Wiley-VCH GmbH.
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|a Transmission electron microscopy (TEM) is a powerful tool for unveiling the structural, compositional, and electronic properties of organic-inorganic hybrid perovskites (OIHPs) at the atomic to micrometer length scales. However, the structural and compositional instability of OIHPs under electron beam radiation results in misunderstandings of the microscopic structure-property-performance relationship in OIHP devices. Here, ultralow dose TEM is utilized to identify the mechanism of the electron-beam-induced changes in OHIPs and clarify the cumulative electron dose thresholds (critical dose) of different commercially interesting state-of-the-art OIHPs, including methylammonium lead iodide (MAPbI3 ), formamidinium lead iodide (FAPbI3 ), FA0.83 Cs0.17 PbI3 , FA0.15 Cs0.85 PbI3 , and MAPb0.5 Sn0.5 I3 . The critical dose is related to the composition of the OIHPs, with FA0.15 Cs0.85 PbI3 having the highest critical dose of ≈84 e Å-2 and FA0.83 Cs0.17 PbI3 having the lowest critical dose of ≈4.2 e Å-2 . The electron beam irradiation results in the formation of a superstructure with ordered I and FA vacancies along <110>c , as identified from the three major crystal axes in cubic FAPbI3 , <100>c , <110>c , and <111>c . The intragrain planar defects in FAPbI3 are stable, while an obvious modification is observed in FA0.83 Cs0.17 PbI3 under continuous electron beam exposure. This information can serve as a guide for ensuring a reliable understanding of the microstructure of OIHP optoelectronic devices by TEM
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|a Journal Article
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|a critical dose
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|a intragrain defects
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|a organic-inorganic hybrid perovskites
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|a structural degradation
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|a transmission electron microscope
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1 |
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|a Zhi, Rui
|e verfasserin
|4 aut
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1 |
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|a Rothmann, Mathias Uller
|e verfasserin
|4 aut
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| 700 |
1 |
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|a Xu, Yue-Yu
|e verfasserin
|4 aut
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| 700 |
1 |
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|a Li, Li-Qi
|e verfasserin
|4 aut
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| 700 |
1 |
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|a Hu, Zhi-Yi
|e verfasserin
|4 aut
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| 700 |
1 |
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|a Pang, Shuping
|e verfasserin
|4 aut
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1 |
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|a Cheng, Yi-Bing
|e verfasserin
|4 aut
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1 |
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|a Van Tendeloo, Gustaaf
|e verfasserin
|4 aut
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| 700 |
1 |
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|a Li, Wei
|e verfasserin
|4 aut
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| 773 |
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|i Enthalten in
|t Advanced materials (Deerfield Beach, Fla.)
|d 1998
|g 35(2023), 17 vom: 13. Apr., Seite e2211207
|w (DE-627)NLM098206397
|x 1521-4095
|7 nnns
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| 773 |
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|g volume:35
|g year:2023
|g number:17
|g day:13
|g month:04
|g pages:e2211207
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|u http://dx.doi.org/10.1002/adma.202211207
|3 Volltext
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