Direct LiF imaging diagnostics on refractive X-ray focusing at the EuXFEL High Energy Density instrument

Direct LiF imaging diagnostics on refractive X-ray focusing at the EuXFEL High Energy Density instrument

open access.

Bibliographische Detailangaben
Veröffentlicht in:Journal of synchrotron radiation. - 1994. - 30(2023), Pt 1 vom: 01. Jan., Seite 208-216
1. Verfasser: Makarov, Sergey (VerfasserIn)
Weitere Verfasser: Makita, Mikako, Nakatsutsumi, Motoaki, Pikuz, Tatiana, Ozaki, Norimasa, Preston, Thomas R, Appel, Karen, Konopkova, Zuzana, Cerantola, Valerio, Brambrink, Erik, Schwinkendorf, Jan Patrick, Mohacsi, Istvan, Burian, Tomas, Chalupsky, Jaromir, Hajkova, Vera, Juha, Libor, Vozda, Vojtech, Nagler, Bob, Zastrau, Ulf, Pikuz, Sergey
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2023
Zugriff auf das übergeordnete Werk:Journal of synchrotron radiation
Schlagworte:Journal Article X-ray beam characterization X-ray focusing X-ray free-electron lasers compound refractive lenses focusing system lithium fluoride (LiF) detector
Beschreibung
Zusammenfassung:open access.
The application of fluorescent crystal media in wide-range X-ray detectors provides an opportunity to directly image the spatial distribution of ultra-intense X-ray beams including investigation of the focal spot of free-electron lasers. Here the capabilities of the micro- and nano-focusing X-ray refractive optics available at the High Energy Density instrument of the European XFEL are reported, as measured in situ by means of a LiF fluorescent detector placed into and around the beam caustic. The intensity distribution of the beam focused down to several hundred nanometers was imaged at 9 keV photon energy. A deviation from the parabolic surface in a stack of nanofocusing Be compound refractive lenses (CRLs) was found to affect the resulting intensity distribution within the beam. Comparison of experimental patterns in the far field with patterns calculated for different CRL lens imperfections allowed the overall inhomogeneity in the CRL stack to be estimated. The precise determination of the focal spot size and shape on a sub-micrometer level is essential for a number of high energy density studies requiring either a pin-size backlighting spot or extreme intensities for X-ray heating
Beschreibung:Date Completed 05.01.2023
Date Revised 10.09.2024
published: Print-Electronic
Citation Status PubMed-not-MEDLINE
ISSN:1600-5775
DOI:10.1107/S1600577522006245