Domain Auto Finder (DAFi) program : the analysis of single-crystal X-ray diffraction data from polycrystalline samples

© Andrey Aslandukov et al. 2022.

Bibliographische Detailangaben
Veröffentlicht in:Journal of applied crystallography. - 1998. - 55(2022), Pt 5 vom: 01. Okt., Seite 1383-1391
1. Verfasser: Aslandukov, Andrey (VerfasserIn)
Weitere Verfasser: Aslandukov, Matvii, Dubrovinskaia, Natalia, Dubrovinsky, Leonid
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2022
Zugriff auf das übergeordnete Werk:Journal of applied crystallography
Schlagworte:Journal Article DAFi multiphase mixtures polycrystalline samples single-crystal X-ray diffraction single-crystal domain auto finder
Beschreibung
Zusammenfassung:© Andrey Aslandukov et al. 2022.
This paper presents the Domain Auto Finder (DAFi) program and its application to the analysis of single-crystal X-ray diffraction (SC-XRD) data from multiphase mixtures of microcrystalline solids and powders. Superposition of numerous reflections originating from a large number of single-crystal domains of the same and/or different (especially unknown) phases usually precludes the sorting of reflections coming from individual domains, making their automatic indexing impossible. The DAFi algorithm is designed to quickly find subsets of reflections from individual domains in a whole set of SC-XRD data. Further indexing of all found subsets can be easily performed using widely accessible crystallographic packages. As the algorithm neither requires a priori crystallographic information nor is limited by the number of phases or individual domains, DAFi is powerful software to be used for studies of multiphase polycrystalline and microcrystalline (powder) materials. The algorithm is validated by testing on X-ray diffraction data sets obtained from real samples: a multi-mineral basalt rock at ambient conditions and products of the chemical reaction of yttrium and nitro-gen in a laser-heated diamond anvil cell at 50 GPa. The high performance of the DAFi algorithm means it can be used for processing SC-XRD data online during experiments at synchrotron facilities
Beschreibung:Date Revised 05.09.2024
published: Electronic-eCollection
Citation Status PubMed-not-MEDLINE
ISSN:0021-8898
DOI:10.1107/S1600576722008081