A new Kirkpatrick-Baez-based scanning microscope for the Submicron Resolution X-ray Spectroscopy (SRX) beamline at NSLS-II

open access.

Bibliographische Detailangaben
Veröffentlicht in:Journal of synchrotron radiation. - 1994. - 29(2022), Pt 5 vom: 01. Sept., Seite 1284-1291
1. Verfasser: Nazaretski, E (VerfasserIn)
Weitere Verfasser: Coburn, D S, Xu, W, Ma, J, Xu, H, Smith, R, Huang, X, Yang, Y, Huang, L, Idir, M, Kiss, A, Chu, Y S
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2022
Zugriff auf das übergeordnete Werk:Journal of synchrotron radiation
Schlagworte:Journal Article KB optics X-ray microscopy X-ray microscopy instrumentation
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520 |a The development, construction, and first commissioning results of a new scanning microscope installed at the 5-ID Submicron Resolution X-ray Spectroscopy (SRX) beamline at NSLS-II are reported. The developed system utilizes Kirkpatrick-Baez mirrors for X-ray focusing. The instrument is designed to enable spectromicroscopy measurements in 2D and 3D with sub-200 nm spatial resolution. The present paper focuses on the design aspects, optical considerations, and specifics of the sample scanning stage, summarizing some of the initial commissioning results 
650 4 |a Journal Article 
650 4 |a KB optics 
650 4 |a X-ray microscopy 
650 4 |a X-ray microscopy instrumentation 
700 1 |a Coburn, D S  |e verfasserin  |4 aut 
700 1 |a Xu, W  |e verfasserin  |4 aut 
700 1 |a Ma, J  |e verfasserin  |4 aut 
700 1 |a Xu, H  |e verfasserin  |4 aut 
700 1 |a Smith, R  |e verfasserin  |4 aut 
700 1 |a Huang, X  |e verfasserin  |4 aut 
700 1 |a Yang, Y  |e verfasserin  |4 aut 
700 1 |a Huang, L  |e verfasserin  |4 aut 
700 1 |a Idir, M  |e verfasserin  |4 aut 
700 1 |a Kiss, A  |e verfasserin  |4 aut 
700 1 |a Chu, Y S  |e verfasserin  |4 aut 
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