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|a 10.1107/S1600577522007561
|2 doi
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|a eng
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|a Mikeházi, Antal
|e verfasserin
|4 aut
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|a Multicolor single-analyzer high-energy-resolution XES spectrometer for simultaneous examination of different elements
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|c 2022
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|a Text
|b txt
|2 rdacontent
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|a ƒaComputermedien
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|2 rdamedia
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|a ƒa Online-Ressource
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|a Date Revised 04.10.2022
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|a published: Print-Electronic
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|a Citation Status PubMed-not-MEDLINE
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|a open access.
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|a The present work demonstrates the performance of a von Hámos high-energy-resolution X-ray spectrometer based on a non-conventional conical Si single-crystal analyzer. The analyzer is tested with different primary and secondary X-ray sources as well as a hard X-ray sensitive CCD camera. The spectrometer setup is also characterized with ray-tracing simulations. Both experimental and simulated results affirm that the conical spectrometer can efficiently detect and resolve the two pairs of two elements (Ni and Cu) Kα X-ray emission spectroscopy (XES) peaks simultaneously, requiring a less than 2 cm-wide array on a single position-sensitive detector. The possible applications of this simple yet broad-energy-spectrum crystal spectrometer range from quickly adapting it as another probe for complex experiments at synchrotron beamlines to analyzing X-ray emission from plasma generated by ultrashort laser pulses at modern laser facilities
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|a Journal Article
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|a X-ray emission spectroscopy
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|a high-energy-resolution X-ray spectroscopies
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|a laser plasma
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|a ray tracing
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|a von Hámos geometry
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|a El Guettioui, Jihad
|e verfasserin
|4 aut
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|a Földes, István B
|e verfasserin
|4 aut
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|a Vankó, György
|e verfasserin
|4 aut
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|a Németh, Zoltán
|e verfasserin
|4 aut
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|i Enthalten in
|t Journal of synchrotron radiation
|d 1994
|g 29(2022), Pt 5 vom: 01. Sept., Seite 1216-1222
|w (DE-627)NLM09824129X
|x 1600-5775
|7 nnns
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|g volume:29
|g year:2022
|g number:Pt 5
|g day:01
|g month:09
|g pages:1216-1222
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|u http://dx.doi.org/10.1107/S1600577522007561
|3 Volltext
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