Multicolor single-analyzer high-energy-resolution XES spectrometer for simultaneous examination of different elements

open access.

Bibliographische Detailangaben
Veröffentlicht in:Journal of synchrotron radiation. - 1994. - 29(2022), Pt 5 vom: 01. Sept., Seite 1216-1222
1. Verfasser: Mikeházi, Antal (VerfasserIn)
Weitere Verfasser: El Guettioui, Jihad, Földes, István B, Vankó, György, Németh, Zoltán
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2022
Zugriff auf das übergeordnete Werk:Journal of synchrotron radiation
Schlagworte:Journal Article X-ray emission spectroscopy high-energy-resolution X-ray spectroscopies laser plasma ray tracing von Hámos geometry
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520 |a The present work demonstrates the performance of a von Hámos high-energy-resolution X-ray spectrometer based on a non-conventional conical Si single-crystal analyzer. The analyzer is tested with different primary and secondary X-ray sources as well as a hard X-ray sensitive CCD camera. The spectrometer setup is also characterized with ray-tracing simulations. Both experimental and simulated results affirm that the conical spectrometer can efficiently detect and resolve the two pairs of two elements (Ni and Cu) Kα X-ray emission spectroscopy (XES) peaks simultaneously, requiring a less than 2 cm-wide array on a single position-sensitive detector. The possible applications of this simple yet broad-energy-spectrum crystal spectrometer range from quickly adapting it as another probe for complex experiments at synchrotron beamlines to analyzing X-ray emission from plasma generated by ultrashort laser pulses at modern laser facilities 
650 4 |a Journal Article 
650 4 |a X-ray emission spectroscopy 
650 4 |a high-energy-resolution X-ray spectroscopies 
650 4 |a laser plasma 
650 4 |a ray tracing 
650 4 |a von Hámos geometry 
700 1 |a El Guettioui, Jihad  |e verfasserin  |4 aut 
700 1 |a Földes, István B  |e verfasserin  |4 aut 
700 1 |a Vankó, György  |e verfasserin  |4 aut 
700 1 |a Németh, Zoltán  |e verfasserin  |4 aut 
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