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231226s2022 xx |||||o 00| ||eng c |
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|a 10.1107/S1600577522007287
|2 doi
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|a pubmed24n1523.xml
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|a (DE-627)NLM345909712
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|a (NLM)36073879
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|a DE-627
|b ger
|c DE-627
|e rakwb
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|a eng
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|a Levcenko, S
|e verfasserin
|4 aut
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|a High-resolution XEOL spectroscopy setup at the X-ray absorption spectroscopy beamline P65 of PETRA III
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|c 2022
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|a Text
|b txt
|2 rdacontent
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|a ƒaComputermedien
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|2 rdamedia
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|a ƒa Online-Ressource
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|2 rdacarrier
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|a Date Revised 04.09.2024
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|a published: Print-Electronic
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|a Citation Status PubMed-not-MEDLINE
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|a open access.
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|a A newly designed setup to perform steady-state X-ray excited optical luminescence (XEOL) spectroscopy and simultaneous XEOL and X-ray absorption spectroscopy characterization at beamline P65 of PETRA III is described. The XEOL setup is equipped with a He-flow cryostat and state-of-the-art optical detection system, which covers a wide wavelength range of 300-1700 nm with a high spectral resolution of 0.4 nm. To demonstrate the setup functioning, low-temperature XEOL studies on polycrystalline CuInSe2 thin film, single-crystalline GaN thin film and single-crystalline ZnO bulk semiconductor samples are performed
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|a Journal Article
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|a CuInSe2
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|a GaN
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|a XAS
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|a XEOL
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|a ZnO
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|a Biller, R
|e verfasserin
|4 aut
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|a Pfeiffelmann, T
|e verfasserin
|4 aut
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|a Ritter, K
|e verfasserin
|4 aut
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1 |
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|a Falk, H H
|e verfasserin
|4 aut
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|a Wang, T
|e verfasserin
|4 aut
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1 |
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|a Siebentritt, S
|e verfasserin
|4 aut
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|a Welter, E
|e verfasserin
|4 aut
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|a Schnohr, C S
|e verfasserin
|4 aut
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| 773 |
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|i Enthalten in
|t Journal of synchrotron radiation
|d 1994
|g 29(2022), Pt 5 vom: 01. Sept., Seite 1209-1215
|w (DE-627)NLM09824129X
|x 1600-5775
|7 nnns
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| 773 |
1 |
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|g volume:29
|g year:2022
|g number:Pt 5
|g day:01
|g month:09
|g pages:1209-1215
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|u http://dx.doi.org/10.1107/S1600577522007287
|3 Volltext
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|h 1209-1215
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