APA Zitierstil

Chen, X., Hu, D., Mescall, R., You, G., Basov, D. N., Dai, Q., & Liu, M. (2022). Modern Scattering-Type Scanning Near-Field Optical Microscopy for Advanced Material Research. Advanced materials (Deerfield Beach, Fla.), 34(36), . https://doi.org/10.1002/adma.202205636

Chicago Zitierstil

Chen, Xinzhong, Debo Hu, Ryan Mescall, Guanjun You, D N. Basov, Qing Dai, und Mengkun Liu. "Modern Scattering-Type Scanning Near-Field Optical Microscopy for Advanced Material Research." Advanced Materials (Deerfield Beach, Fla.) 34, no. 36 (2022). https://dx.doi.org/10.1002/adma.202205636.

MLA Zitierstil

Chen, Xinzhong, et al. "Modern Scattering-Type Scanning Near-Field Optical Microscopy for Advanced Material Research." Advanced Materials (Deerfield Beach, Fla.), vol. 34, no. 36, 2022.