Structure and Properties of Ultrathin SiOx Films on Cu(111)

The metal-oxide interface plays a crucial role in catalysis, and it has attracted increasing interest in recent years. Cu/SiO2, as a common copper-based catalyst, has been widely used in industrial catalysis. However, it is still a challenge to clarify the structures of the interface of Cu-SiOx and...

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Veröffentlicht in:Langmuir : the ACS journal of surfaces and colloids. - 1985. - 38(2022), 37 vom: 20. Sept., Seite 11414-11420
1. Verfasser: Xu, Jie (VerfasserIn)
Weitere Verfasser: Mu, Changle, Chen, Mingshu
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2022
Zugriff auf das übergeordnete Werk:Langmuir : the ACS journal of surfaces and colloids
Schlagworte:Journal Article
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520 |a The metal-oxide interface plays a crucial role in catalysis, and it has attracted increasing interest in recent years. Cu/SiO2, as a common copper-based catalyst, has been widely used in industrial catalysis. However, it is still a challenge to clarify the structures of the interface of Cu-SiOx and the effect on catalytic performance. Herein, we prepared ultrathin SiOx films by evaporating Si onto a Cu(111) surface followed by annealing in an O2 atmosphere, which were characterized by various surface science techniques. The results showed that a SiOx film could grow nearly layer-by-layer on the Cu(111) surface in the present condition. Both X-ray photoelectron spectroscopy (XPS) and high-resolution electron energy loss spectroscopy (HREELS) results confirmed the presence of Cu-O-Si and Si-O-Si species. Thermal stability experiments illustrated that the well-ordered silica films were stable under annealing in vacuum. The feature of CO adsorption suggested a CO-Cuδ+ species induced from the Cuδ+-O-Si. Low-energy ion scattering spectroscopy (LEIS) and XPS results demonstrated that some Cu2O appeared on the surface when the 1 ML SiOx/Cu(111) was exposed in O2 at 353 K 
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700 1 |a Chen, Mingshu  |e verfasserin  |4 aut 
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