The dynamics of silicon deposition in the sorghum root endodermis
• The dynamics of silica deposition and Si aggregates formation in inner tangential walls of root endodermal cells, which occurs as an additional stage of endodermal development in sorghum (Sorghum bicolor), were studied. • An environmental scanning electron microscope (ESEM) and X-ray microanalyz...
Ausführliche Beschreibung
Bibliographische Detailangaben
| Veröffentlicht in: | The New phytologist. - 1979. - 158(2003), 3 vom: 15. Juni, Seite 437-441
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| 1. Verfasser: |
Lux, Alexander
(VerfasserIn) |
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| Weitere Verfasser: |
Luxová, Miroslava,
Abe, Jun,
Tanimoto, Eiichi,
Hattori, Taiichiro,
Inanaga, Shinobu |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2003
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| Zugriff auf das übergeordnete Werk: | The New phytologist
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| Schlagworte: | Journal Article
Sorghum bicolor (sorghum)
X-ray microanalysis
endodermis
environmental scanning electron microscope (ESEM)
root
silicon (Si) deposition |
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