Insight into the Experimental Error in the Mapping of Electrical Properties with Electrostatic Force Microscopy
Electrostatic force microscopy (EFM) is an emergent, powerful technique for nanoscale detection of electrical properties such as permittivity and charge distribution. However, the surface irregularity of samples has been unfortunately overlooked in most EFM studies. Herein, we use a polymer nanocomp...
Ausführliche Beschreibung
Bibliographische Detailangaben
| Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1992. - 38(2022), 28 vom: 19. Juli, Seite 8534-8544
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| 1. Verfasser: |
Wang, Shaojie
(VerfasserIn) |
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| Weitere Verfasser: |
Fan, Linzhen,
Luo, Zhen,
Li, Junluo,
Li, Lingfan,
He, Jinliang,
Li, Qi |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2022
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| Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids
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| Schlagworte: | Journal Article |
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