Pre-Buried Additive for Cross-Layer Modification in Flexible Perovskite Solar Cells with Efficiency Exceeding 22

© 2022 Wiley-VCH GmbH.

Bibliographische Detailangaben
Veröffentlicht in:Advanced materials (Deerfield Beach, Fla.). - 1998. - 34(2022), 21 vom: 20. Mai, Seite e2109879
1. Verfasser: Zheng, Zhonghao (VerfasserIn)
Weitere Verfasser: Li, Faming, Gong, Jue, Ma, Yinyi, Gu, Jinwen, Liu, Xiaochun, Chen, Shuhan, Liu, Mingzhen
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2022
Zugriff auf das übergeordnete Werk:Advanced materials (Deerfield Beach, Fla.)
Schlagworte:Journal Article flexible perovskite solar cells interfacial adhesion mechanical durability pre-buried additives residual stress
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520 |a Halide perovskites have shown superior potentials in flexible photovoltaics due to their soft and high power-to-weight nature. However, interfacial residual stress and lattice mismatch due to the large deformation of flexible substrates have greatly limited the performance of flexible perovskite solar cells (F-PSCs). Here, ammonium formate (HCOONH4 ) is used as a pre-buried additive in electron transport layer (ETL) to realize a bottom-up infiltration process for an in situ, integral modification of ETL, perovskite layer, and their interface. The HCOONH4 treatment leads to an enhanced electron extraction in ETL, relaxed residual strain and micro-strain in perovskite film, along with reduced defect densities within these layers. As a result, a top power conversion efficiency of 22.37% and a certified 21.9% on F-PSCs are achieved, representing the highest performance reported so far. This work links the critical connection between multilayer mechanics/defect profiles of ETL-perovskite structure and device performance, thus providing meaningful scientific direction to further narrowing the efficiency gap between F-PSCs and rigid-substrate counterparts 
650 4 |a Journal Article 
650 4 |a flexible perovskite solar cells 
650 4 |a interfacial adhesion 
650 4 |a mechanical durability 
650 4 |a pre-buried additives 
650 4 |a residual stress 
700 1 |a Li, Faming  |e verfasserin  |4 aut 
700 1 |a Gong, Jue  |e verfasserin  |4 aut 
700 1 |a Ma, Yinyi  |e verfasserin  |4 aut 
700 1 |a Gu, Jinwen  |e verfasserin  |4 aut 
700 1 |a Liu, Xiaochun  |e verfasserin  |4 aut 
700 1 |a Chen, Shuhan  |e verfasserin  |4 aut 
700 1 |a Liu, Mingzhen  |e verfasserin  |4 aut 
773 0 8 |i Enthalten in  |t Advanced materials (Deerfield Beach, Fla.)  |d 1998  |g 34(2022), 21 vom: 20. Mai, Seite e2109879  |w (DE-627)NLM098206397  |x 1521-4095  |7 nnns 
773 1 8 |g volume:34  |g year:2022  |g number:21  |g day:20  |g month:05  |g pages:e2109879 
856 4 0 |u http://dx.doi.org/10.1002/adma.202109879  |3 Volltext 
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