Deep-learning-based image registration for nano-resolution tomographic reconstruction

Nano-resolution full-field transmission X-ray microscopy has been successfully applied to a wide range of research fields thanks to its capability of non-destructively reconstructing the 3D structure with high resolution. Due to constraints in the practical implementations, the nano-tomography data...

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Publié dans:Journal of synchrotron radiation. - 1994. - 28(2021), Pt 6 vom: 01. Nov., Seite 1909-1915
Auteur principal: Fu, Tianyu (Auteur)
Autres auteurs: Zhang, Kai, Wang, Yan, Li, Jizhou, Zhang, Jin, Yao, Chunxia, He, Qili, Wang, Shanfeng, Huang, Wanxia, Yuan, Qingxi, Pianetta, Piero, Liu, Yijin
Format: Article en ligne
Langue:English
Publié: 2021
Accès à la collection:Journal of synchrotron radiation
Sujets:Journal Article deep learning full-field transmission X-ray microscopy image registration nano-tomography residual neural network
Description
Résumé:Nano-resolution full-field transmission X-ray microscopy has been successfully applied to a wide range of research fields thanks to its capability of non-destructively reconstructing the 3D structure with high resolution. Due to constraints in the practical implementations, the nano-tomography data is often associated with a random image jitter, resulting from imperfections in the hardware setup. Without a proper image registration process prior to the reconstruction, the quality of the result will be compromised. Here a deep-learning-based image jitter correction method is presented, which registers the projective images with high efficiency and accuracy, facilitating a high-quality tomographic reconstruction. This development is demonstrated and validated using synthetic and experimental datasets. The method is effective and readily applicable to a broad range of applications. Together with this paper, the source code is published and adoptions and improvements from our colleagues in this field are welcomed
Description:Date Revised 08.11.2021
published: Print-Electronic
Citation Status PubMed-not-MEDLINE
ISSN:1600-5775
DOI:10.1107/S1600577521008481