Multilateral surface analysis of the CeB6 electron-gun cathode used at SACLA XFEL

The CeB6(001) single crystal used as a cathode in a low-emittance electron gun and operated at the free-electron laser facility SACLA was investigated using cathode lens electron microscopy combined with X-ray spectroscopy at SPring-8 synchrotron radiation facility. Multilateral analysis using therm...

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Veröffentlicht in:Journal of synchrotron radiation. - 1994. - 28(2021), Pt 6 vom: 01. Nov., Seite 1729-1736
1. Verfasser: Ohkochi, Takuo (VerfasserIn)
Weitere Verfasser: Muro, Takayuki, Ikenaga, Eiji, Togawa, Kazuaki, Yasui, Akira, Kotsugi, Masato, Oura, Masaki, Tanaka, Hitoshi
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2021
Zugriff auf das übergeordnete Werk:Journal of synchrotron radiation
Schlagworte:Journal Article CeB6 LEEM PEEM TEEM microstructures photoemission synchrotron radiation thermally activated processes thermionic electron cathode
Beschreibung
Zusammenfassung:The CeB6(001) single crystal used as a cathode in a low-emittance electron gun and operated at the free-electron laser facility SACLA was investigated using cathode lens electron microscopy combined with X-ray spectroscopy at SPring-8 synchrotron radiation facility. Multilateral analysis using thermionic emission electron microscopy, low-energy electron microscopy, ultraviolet and X-ray photoemission electron microscopy and hard X-ray photoemission spectroscopy revealed that the thermionic electrons are emitted strongly and evenly from the CeB6 surface after pre-activation treatment (annealing at 1500°C for >1 h) and that the thermionic emission intensity as well as elemental composition vary between the central area and the edge of the old CeB6 surface
Beschreibung:Date Revised 08.11.2021
published: Print-Electronic
Citation Status PubMed-not-MEDLINE
ISSN:1600-5775
DOI:10.1107/S1600577521009656