Multilateral surface analysis of the CeB6 electron-gun cathode used at SACLA XFEL
The CeB6(001) single crystal used as a cathode in a low-emittance electron gun and operated at the free-electron laser facility SACLA was investigated using cathode lens electron microscopy combined with X-ray spectroscopy at SPring-8 synchrotron radiation facility. Multilateral analysis using therm...
Veröffentlicht in: | Journal of synchrotron radiation. - 1994. - 28(2021), Pt 6 vom: 01. Nov., Seite 1729-1736 |
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1. Verfasser: | |
Weitere Verfasser: | , , , , , , |
Format: | Online-Aufsatz |
Sprache: | English |
Veröffentlicht: |
2021
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Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation |
Schlagworte: | Journal Article CeB6 LEEM PEEM TEEM microstructures photoemission synchrotron radiation thermally activated processes thermionic electron cathode |
Zusammenfassung: | The CeB6(001) single crystal used as a cathode in a low-emittance electron gun and operated at the free-electron laser facility SACLA was investigated using cathode lens electron microscopy combined with X-ray spectroscopy at SPring-8 synchrotron radiation facility. Multilateral analysis using thermionic emission electron microscopy, low-energy electron microscopy, ultraviolet and X-ray photoemission electron microscopy and hard X-ray photoemission spectroscopy revealed that the thermionic electrons are emitted strongly and evenly from the CeB6 surface after pre-activation treatment (annealing at 1500°C for >1 h) and that the thermionic emission intensity as well as elemental composition vary between the central area and the edge of the old CeB6 surface |
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Beschreibung: | Date Revised 08.11.2021 published: Print-Electronic Citation Status PubMed-not-MEDLINE |
ISSN: | 1600-5775 |
DOI: | 10.1107/S1600577521009656 |