Physics-Based Noise Modeling for Extreme Low-Light Photography
Enhancing the visibility in extreme low-light environments is a challenging task. Under nearly lightless condition, existing image denoising methods could easily break down due to significantly low SNR. In this paper, we systematically study the noise statistics in the imaging pipeline of CMOS photo...
| Veröffentlicht in: | IEEE transactions on pattern analysis and machine intelligence. - 1979. - 44(2022), 11 vom: 01. Nov., Seite 8520-8537 |
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| Format: | Online-Aufsatz |
| Sprache: | English |
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2022
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| Zugriff auf das übergeordnete Werk: | IEEE transactions on pattern analysis and machine intelligence |
| Schlagworte: | Journal Article |
| Online verfügbar |
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