Structural Evolution of Layered Manganese Oxysulfides during Reversible Electrochemical Lithium Insertion and Copper Extrusion

© 2021 The Authors. Published by American Chemical Society.

Bibliographische Detailangaben
Veröffentlicht in:Chemistry of materials : a publication of the American Chemical Society. - 1998. - 33(2021), 11 vom: 08. Juni, Seite 3989-4005
1. Verfasser: Dey, Sunita (VerfasserIn)
Weitere Verfasser: Zeng, Dongli, Adamson, Paul, Cabana, Jordi, Indris, Sylvio, Lu, Jingyu, Clarke, Simon J, Grey, Clare P
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2021
Zugriff auf das übergeordnete Werk:Chemistry of materials : a publication of the American Chemical Society
Schlagworte:Journal Article
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520 |a The electrochemical lithiation and delithiation of the layered oxysulfide Sr2MnO2Cu4-δS3 has been investigated by using a combination of in situ powder X-ray diffraction and ex situ neutron powder diffraction, X-ray absorption and 7Li NMR spectroscopy, together with a range of electrochemical experiments. Sr2MnO2Cu4-δS3 consists of [Sr2MnO2] perovskite-type cationic layers alternating with highly defective antifluorite-type [Cu4-δS3] (δ ≈ 0.5) anionic layers. It undergoes a combined displacement/intercalation (CDI) mechanism on reaction with Li, where the inserted Li replaces Cu, forming Li4S3 slabs and Cu+ is reduced and extruded as metallic particles. For the initial 2-3% of the first discharge process, the vacant sites in the sulfide layer are filled by Li; Cu extrusion then accompanies further insertion of Li. Mn2.5+ is reduced to Mn2+ during the first half of the discharge. The overall charging process involves the removal of Li and re-insertion of Cu into the sulfide layers with re-oxidation of Mn2+ to Mn2.5+. However, due to the different diffusivities of Li and Cu, the processes operating on charge are quite different from those operating during the first discharge: charging to 2.75 V results in the removal of most of the Li, little reinsertion of Cu, and good capacity retention. A charge to 3.75 V is required to fully reinsert Cu, which results in significant changes to the sulfide sublattice during the following discharge and poor capacity retention. This detailed structure-property investigation will promote the design of new functional electrodes with improved device performance 
650 4 |a Journal Article 
700 1 |a Zeng, Dongli  |e verfasserin  |4 aut 
700 1 |a Adamson, Paul  |e verfasserin  |4 aut 
700 1 |a Cabana, Jordi  |e verfasserin  |4 aut 
700 1 |a Indris, Sylvio  |e verfasserin  |4 aut 
700 1 |a Lu, Jingyu  |e verfasserin  |4 aut 
700 1 |a Clarke, Simon J  |e verfasserin  |4 aut 
700 1 |a Grey, Clare P  |e verfasserin  |4 aut 
773 0 8 |i Enthalten in  |t Chemistry of materials : a publication of the American Chemical Society  |d 1998  |g 33(2021), 11 vom: 08. Juni, Seite 3989-4005  |w (DE-627)NLM098194763  |x 0897-4756  |7 nnns 
773 1 8 |g volume:33  |g year:2021  |g number:11  |g day:08  |g month:06  |g pages:3989-4005 
856 4 0 |u http://dx.doi.org/10.1021/acs.chemmater.1c00375  |3 Volltext 
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