Accurate background correction in neutron reflectometry studies of soft condensed matter films in contact with fluid reservoirs

Neutron reflectometry (NR) is a powerful method for looking at the structures of multilayered thin films, including biomolecules on surfaces, particularly proteins at lipid interfaces. The spatial resolution of the film structure obtained through an NR experiment is limited by the maximum wavevector...

Ausführliche Beschreibung

Bibliographische Detailangaben
Veröffentlicht in:Journal of applied crystallography. - 1998. - 53(2020), 1 vom: 30.
1. Verfasser: Hoogerheide, David P (VerfasserIn)
Weitere Verfasser: Heinrich, Frank, Maranville, Brian B, Majkrzak, Charles F
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2020
Zugriff auf das übergeordnete Werk:Journal of applied crystallography
Schlagworte:Journal Article background subtraction data reduction incoherent scattering neutron reflectometry soft condensed matter thin films