Mitigating background caused by extraneous scattering in small-angle neutron scattering instrument design

© J. G. Barker et al. 2021.

Bibliographische Detailangaben
Veröffentlicht in:Journal of applied crystallography. - 1998. - 54(2021), Pt 2 vom: 01. Apr., Seite 461-472
1. Verfasser: Barker, John George (VerfasserIn)
Weitere Verfasser: Cook, Jeremy C, Chabot, Jean Philippe, Kline, Steven R, Zhang, Zhenhuan, Gagnon, Cedric
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2021
Zugriff auf das übergeordnete Werk:Journal of applied crystallography
Schlagworte:Journal Article SANS albedo background extraneous scattering small-angle neutron scattering
LEADER 01000caa a22002652c 4500
001 NLM325062080
003 DE-627
005 20250301145155.0
007 cr uuu---uuuuu
008 231225s2021 xx |||||o 00| ||eng c
024 7 |a 10.1107/S1600576721001084  |2 doi 
028 5 2 |a pubmed25n1083.xml 
035 |a (DE-627)NLM325062080 
035 |a (NLM)33953652 
040 |a DE-627  |b ger  |c DE-627  |e rakwb 
041 |a eng 
100 1 |a Barker, John George  |e verfasserin  |4 aut 
245 1 0 |a Mitigating background caused by extraneous scattering in small-angle neutron scattering instrument design 
264 1 |c 2021 
336 |a Text  |b txt  |2 rdacontent 
337 |a ƒaComputermedien  |b c  |2 rdamedia 
338 |a ƒa Online-Ressource  |b cr  |2 rdacarrier 
500 |a Date Revised 16.07.2022 
500 |a published: Electronic-eCollection 
500 |a Citation Status PubMed-not-MEDLINE 
520 |a © J. G. Barker et al. 2021. 
520 |a Measurements, calculations and design ideas to mitigate background caused by extraneous scattering in small-angle neutron scattering (SANS) instruments are presented. Scattering includes processes such as incoherent scattering, inelastic scattering and Bragg diffraction. Three primary sources of this type of background are investigated: the beam stop located in front of the detector, the inside lining of the detector vessel and the environment surrounding the sample. SANS measurements were made where materials with different albedos were placed in all three locations. Additional measurements of the angle-dependent scattering over the angular range of 0.7π-0.95π rad were completed on 16 different shielding materials at five wavelengths. The data were extrapolated to cover scattering angles from π/2 to π rad in order to estimate the materials' albedos. Modifications to existing SANS instruments and sample environments to mitigate extraneous scattering from surfaces are discussed 
650 4 |a Journal Article 
650 4 |a SANS 
650 4 |a albedo 
650 4 |a background 
650 4 |a extraneous scattering 
650 4 |a small-angle neutron scattering 
700 1 |a Cook, Jeremy C  |e verfasserin  |4 aut 
700 1 |a Chabot, Jean Philippe  |e verfasserin  |4 aut 
700 1 |a Kline, Steven R  |e verfasserin  |4 aut 
700 1 |a Zhang, Zhenhuan  |e verfasserin  |4 aut 
700 1 |a Gagnon, Cedric  |e verfasserin  |4 aut 
773 0 8 |i Enthalten in  |t Journal of applied crystallography  |d 1998  |g 54(2021), Pt 2 vom: 01. Apr., Seite 461-472  |w (DE-627)NLM098121561  |x 0021-8898  |7 nnas 
773 1 8 |g volume:54  |g year:2021  |g number:Pt 2  |g day:01  |g month:04  |g pages:461-472 
856 4 0 |u http://dx.doi.org/10.1107/S1600576721001084  |3 Volltext 
912 |a GBV_USEFLAG_A 
912 |a SYSFLAG_A 
912 |a GBV_NLM 
912 |a GBV_ILN_350 
951 |a AR 
952 |d 54  |j 2021  |e Pt 2  |b 01  |c 04  |h 461-472