Atomic force microscopy study of isolated ivy leaf cuticles observed directly and after embedding in Epon®

The first results obtained by atomic force microscopy (AFM) of the fine structure of isolated ivy leaf cuticles are reported. Observations of transverse sections embedded in Epon® allow easy recognition of the general shape of cuticles as viewed by light microscopy. The surface profile shows irregul...

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Bibliographische Detailangaben

Veröffentlicht in:	The New phytologist. - 1979. - 134(1996), 4 vom: 18. Dez., Seite 571-577
1. Verfasser:	Canet, D (VerfasserIn)
Weitere Verfasser:	Rohr, R, Chamel, A, Guillain, F
Format:	Online-Aufsatz
Sprache:	English
Veröffentlicht:	1996
Zugriff auf das übergeordnete Werk:	The New phytologist
Schlagworte:	Journal Article AFM Isolated ivy leaf cuticle atomic force microscopy ultrastructure