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231225s2021 xx |||||o 00| ||eng c |
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|a 10.1002/adma.202006993
|2 doi
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|a pubmed25n1076.xml
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|a (DE-627)NLM322901006
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|a (NLM)33733524
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|a DE-627
|b ger
|c DE-627
|e rakwb
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|a eng
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|a Stassin, Timothée
|e verfasserin
|4 aut
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|a Porosimetry for Thin Films of Metal-Organic Frameworks
|b A Comparison of Positron Annihilation Lifetime Spectroscopy and Adsorption-Based Methods
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|c 2021
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|a Text
|b txt
|2 rdacontent
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|a ƒaComputermedien
|b c
|2 rdamedia
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|a ƒa Online-Ressource
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|2 rdacarrier
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|a Date Revised 27.04.2021
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|a published: Print-Electronic
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|a Citation Status PubMed-not-MEDLINE
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|a © 2021 Wiley-VCH GmbH.
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|a Thin films of crystalline and porous metal-organic frameworks (MOFs) have great potential in membranes, sensors, and microelectronic chips. While the morphology and crystallinity of MOF films can be evaluated using widely available techniques, characterizing their pore size, pore volume, and specific surface area is challenging due to the low amount of material and substrate effects. Positron annihilation lifetime spectroscopy (PALS) is introduced as a powerful method to obtain pore size information and depth profiling in MOF films. The complementarity of this approach to established physisorption-based methods such as quartz crystal microbalance (QCM) gravimetry, ellipsometric porosimetry (EP), and Kr physisorption (KrP) is illustrated. This comprehensive discussion on MOF thin film porosimetry is supported by experimental data for thin films of ZIF-8
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|a Journal Article
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|a Review
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|a adsorption
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|a metal-organic frameworks
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|a porosimetry
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|a porous materials
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|a positron annihilation lifetime spectroscopy
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|a thin films
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|a Verbeke, Rhea
|e verfasserin
|4 aut
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|a Cruz, Alexander John
|e verfasserin
|4 aut
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|a Rodríguez-Hermida, Sabina
|e verfasserin
|4 aut
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|a Stassen, Ivo
|e verfasserin
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|a Marreiros, João
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|4 aut
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|a Krishtab, Mikhail
|e verfasserin
|4 aut
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|a Dickmann, Marcel
|e verfasserin
|4 aut
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|a Egger, Werner
|e verfasserin
|4 aut
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|a Vankelecom, Ivo F J
|e verfasserin
|4 aut
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|a Furukawa, Shuhei
|e verfasserin
|4 aut
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|a De Vos, Dirk
|e verfasserin
|4 aut
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|a Grosso, David
|e verfasserin
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|a Thommes, Matthias
|e verfasserin
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|a Ameloot, Rob
|e verfasserin
|4 aut
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| 773 |
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|i Enthalten in
|t Advanced materials (Deerfield Beach, Fla.)
|d 1998
|g 33(2021), 17 vom: 15. Apr., Seite e2006993
|w (DE-627)NLM098206397
|x 1521-4095
|7 nnas
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| 773 |
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|g volume:33
|g year:2021
|g number:17
|g day:15
|g month:04
|g pages:e2006993
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|u http://dx.doi.org/10.1002/adma.202006993
|3 Volltext
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|a GBV_USEFLAG_A
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|a SYSFLAG_A
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| 912 |
|
|
|a GBV_NLM
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| 912 |
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|a GBV_ILN_350
|
| 951 |
|
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|a AR
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| 952 |
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|d 33
|j 2021
|e 17
|b 15
|c 04
|h e2006993
|