Robust Ellipse Fitting With Laplacian Kernel Based Maximum Correntropy Criterion
The performance of ellipse fitting may significantly degrade in the presence of outliers, which can be caused by occlusion of the object, mirror reflection or other objects in the process of edge detection. In this paper, we propose an ellipse fitting method that is robust against the outliers, and...
| Publié dans: | IEEE transactions on image processing : a publication of the IEEE Signal Processing Society. - 1992. - 30(2021) vom: 18., Seite 3127-3141 |
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| Auteur principal: | |
| Autres auteurs: | , , |
| Format: | Article en ligne |
| Langue: | English |
| Publié: |
2021
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| Accès à la collection: | IEEE transactions on image processing : a publication of the IEEE Signal Processing Society |
| Sujets: | Journal Article |
| Accès en ligne |
Volltext |