Development of a high-precision XYZ translator and estimation of beam profile of the vacuum ultraviolet and soft X-ray undulator beamline BL-13B at the Photon Factory

A high-precision XYZ translator was developed for the microanalysis of electronic structures and chemical compositions on material surfaces by electron spectroscopy techniques, such as photoelectron spectroscopy and absorption spectroscopy, utilizing the vacuum ultraviolet and soft X-ray synchrotron...

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Publié dans:Journal of synchrotron radiation. - 1994. - 27(2020), Pt 4 vom: 01. Juli, Seite 923-933
Auteur principal: Aiura, Yoshihiro (Auteur)
Autres auteurs: Ozawa, Kenichi, Mase, Kazuhiko, Minohara, Makoto, Suzuki, Satoshi
Format: Article en ligne
Langue:English
Publié: 2020
Accès à la collection:Journal of synchrotron radiation
Sujets:Journal Article XYZ manipulator beamline microspectroscopy scanning microscopy