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231225s2021 xx |||||o 00| ||eng c |
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|a 10.1107/S1600577520015416
|2 doi
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|a eng
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|a Glatzel, Pieter
|e verfasserin
|4 aut
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|a The five-analyzer point-to-point scanning crystal spectrometer at ESRF ID26
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|c 2021
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|a Text
|b txt
|2 rdacontent
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|a ƒaComputermedien
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|2 rdamedia
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|a ƒa Online-Ressource
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|a Date Revised 06.01.2021
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|a published: Print-Electronic
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|a Citation Status PubMed-not-MEDLINE
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|a X-ray emission spectroscopy in a point-to-point focusing geometry using instruments that employ more than one analyzer crystal poses challenges with respect to mechanical design and performance. This work discusses various options for positioning the components and provides the formulas for calculating their relative placement. Ray-tracing calculations were used to determine the geometrical contributions to the energy broadening including the source volume as given by the beam footprint on the sample. The alignment of the instrument is described and examples are given for the performance
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|a Journal Article
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|a Johann geometry
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|a Rowland circle
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|a X-ray emission spectrometers
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|a crystal analyzers
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|a Harris, Alistair
|e verfasserin
|4 aut
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|a Marion, Philippe
|e verfasserin
|4 aut
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|a Sikora, Marcin
|e verfasserin
|4 aut
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|a Weng, Tsu Chien
|e verfasserin
|4 aut
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|a Guilloud, Cyril
|e verfasserin
|4 aut
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|a Lafuerza, Sara
|e verfasserin
|4 aut
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|a Rovezzi, Mauro
|e verfasserin
|4 aut
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|a Detlefs, Blanka
|e verfasserin
|4 aut
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|a Ducotté, Ludovic
|e verfasserin
|4 aut
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| 773 |
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|i Enthalten in
|t Journal of synchrotron radiation
|d 1994
|g 28(2021), Pt 1 vom: 01. Jan., Seite 362-371
|w (DE-627)NLM09824129X
|x 1600-5775
|7 nnns
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| 773 |
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|g volume:28
|g year:2021
|g number:Pt 1
|g day:01
|g month:01
|g pages:362-371
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|u http://dx.doi.org/10.1107/S1600577520015416
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|d 28
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