Structural and Double Layer Forces between Silica Surfaces in Suspensions of Negatively Charged Nanoparticles
Direct force measurements between negatively charged silica microparticles are carried out in suspensions of like-charged nanoparticles with atomic force microscopy (AFM). In agreement with previous studies, oscillatory force profiles are observed at larger separation distances. At smaller distances...
Ausführliche Beschreibung
Bibliographische Detailangaben
| Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1992. - 36(2020), 47 vom: 01. Dez., Seite 14443-14452
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| 1. Verfasser: |
Scarratt, Liam R J
(VerfasserIn) |
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| Weitere Verfasser: |
Kubiak, Katarzyna,
Maroni, Plinio,
Trefalt, Gregor,
Borkovec, Michal |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2020
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| Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids
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| Schlagworte: | Journal Article |
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