Sunday, D. F., Chen, X., Albrecht, T. R., Nowak, D., Delgadillo, P. R., Dazai, T., . . . Kline, R. J. (2020). The Influence of Additives on the Interfacial Width and Line Edge Roughness in Block Copolymer Lithography. Chemistry of materials : a publication of the American Chemical Society, 32(6), .
Style de citation ChicagoSunday, Daniel F., et al. "The Influence of Additives on the Interfacial Width and Line Edge Roughness in Block Copolymer Lithography." Chemistry of Materials : A Publication of the American Chemical Society 32, no. 6 (2020).
Style de citation MLASunday, Daniel F., et al. "The Influence of Additives on the Interfacial Width and Line Edge Roughness in Block Copolymer Lithography." Chemistry of Materials : A Publication of the American Chemical Society, vol. 32, no. 6, 2020.