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231225s2020 xx |||||o 00| ||eng c |
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|a 10.1107/S1600577520009868
|2 doi
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|a pubmed25n1048.xml
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|a (NLM)32876613
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|a DE-627
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|c DE-627
|e rakwb
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|a eng
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| 100 |
1 |
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|a Nakamura, Nami
|e verfasserin
|4 aut
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| 245 |
1 |
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|a Focus characterization of an X-ray free-electron laser by intensity correlation measurement of X-ray fluorescence
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|c 2020
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|a Text
|b txt
|2 rdacontent
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|a ƒaComputermedien
|b c
|2 rdamedia
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|a ƒa Online-Ressource
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|2 rdacarrier
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|a Date Revised 12.11.2023
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|a published: Print-Electronic
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|a Citation Status PubMed-not-MEDLINE
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|a open access.
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|a This paper proposes and demonstrates a simple method using the intensity correlation of X-ray fluorescence to evaluate the focused beam size of an X-ray free-electron laser (XFEL). This method was applied to the sub-micrometre focused XFEL beam at the SPring-8 Angstrom Compact Free Electron Laser, and the beam size evaluated using the proposed method was consistent with that measured using the knife-edge scan method. The proposed method is readily applicable to extremely small X-ray spots and can be applied for the precise diagnostics of sub-10 nm focused X-ray beams which have recently emerged
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|a Journal Article
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|a Intensity correlation
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|a SACLA
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|a X-ray fluorescence
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|a X-ray focusing
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|a X-ray free-electron lasers
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|a focus characterization
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|a Matsuyama, Satoshi
|e verfasserin
|4 aut
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| 700 |
1 |
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|a Inoue, Takato
|e verfasserin
|4 aut
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| 700 |
1 |
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|a Inoue, Ichiro
|e verfasserin
|4 aut
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| 700 |
1 |
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|a Yamada, Jumpei
|e verfasserin
|4 aut
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| 700 |
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|a Osaka, Taito
|e verfasserin
|4 aut
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| 700 |
1 |
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|a Yabashi, Makina
|e verfasserin
|4 aut
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| 700 |
1 |
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|a Ishikawa, Tetsuya
|e verfasserin
|4 aut
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| 700 |
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|a Yamauchi, Kazuto
|e verfasserin
|4 aut
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| 773 |
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|i Enthalten in
|t Journal of synchrotron radiation
|d 1994
|g 27(2020), Pt 5 vom: 01. Sept., Seite 1366-1371
|w (DE-627)NLM09824129X
|x 1600-5775
|7 nnas
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| 773 |
1 |
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|g volume:27
|g year:2020
|g number:Pt 5
|g day:01
|g month:09
|g pages:1366-1371
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|u http://dx.doi.org/10.1107/S1600577520009868
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|h 1366-1371
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