Focus characterization of an X-ray free-electron laser by intensity correlation measurement of X-ray fluorescence

open access.

Bibliographische Detailangaben
Veröffentlicht in:Journal of synchrotron radiation. - 1994. - 27(2020), Pt 5 vom: 01. Sept., Seite 1366-1371
1. Verfasser: Nakamura, Nami (VerfasserIn)
Weitere Verfasser: Matsuyama, Satoshi, Inoue, Takato, Inoue, Ichiro, Yamada, Jumpei, Osaka, Taito, Yabashi, Makina, Ishikawa, Tetsuya, Yamauchi, Kazuto
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2020
Zugriff auf das übergeordnete Werk:Journal of synchrotron radiation
Schlagworte:Journal Article Intensity correlation SACLA X-ray fluorescence X-ray focusing X-ray free-electron lasers focus characterization
LEADER 01000caa a22002652c 4500
001 NLM314495622
003 DE-627
005 20250227221131.0
007 cr uuu---uuuuu
008 231225s2020 xx |||||o 00| ||eng c
024 7 |a 10.1107/S1600577520009868  |2 doi 
028 5 2 |a pubmed25n1048.xml 
035 |a (DE-627)NLM314495622 
035 |a (NLM)32876613 
040 |a DE-627  |b ger  |c DE-627  |e rakwb 
041 |a eng 
100 1 |a Nakamura, Nami  |e verfasserin  |4 aut 
245 1 0 |a Focus characterization of an X-ray free-electron laser by intensity correlation measurement of X-ray fluorescence 
264 1 |c 2020 
336 |a Text  |b txt  |2 rdacontent 
337 |a ƒaComputermedien  |b c  |2 rdamedia 
338 |a ƒa Online-Ressource  |b cr  |2 rdacarrier 
500 |a Date Revised 12.11.2023 
500 |a published: Print-Electronic 
500 |a Citation Status PubMed-not-MEDLINE 
520 |a open access. 
520 |a This paper proposes and demonstrates a simple method using the intensity correlation of X-ray fluorescence to evaluate the focused beam size of an X-ray free-electron laser (XFEL). This method was applied to the sub-micrometre focused XFEL beam at the SPring-8 Angstrom Compact Free Electron Laser, and the beam size evaluated using the proposed method was consistent with that measured using the knife-edge scan method. The proposed method is readily applicable to extremely small X-ray spots and can be applied for the precise diagnostics of sub-10 nm focused X-ray beams which have recently emerged 
650 4 |a Journal Article 
650 4 |a Intensity correlation 
650 4 |a SACLA 
650 4 |a X-ray fluorescence 
650 4 |a X-ray focusing 
650 4 |a X-ray free-electron lasers 
650 4 |a focus characterization 
700 1 |a Matsuyama, Satoshi  |e verfasserin  |4 aut 
700 1 |a Inoue, Takato  |e verfasserin  |4 aut 
700 1 |a Inoue, Ichiro  |e verfasserin  |4 aut 
700 1 |a Yamada, Jumpei  |e verfasserin  |4 aut 
700 1 |a Osaka, Taito  |e verfasserin  |4 aut 
700 1 |a Yabashi, Makina  |e verfasserin  |4 aut 
700 1 |a Ishikawa, Tetsuya  |e verfasserin  |4 aut 
700 1 |a Yamauchi, Kazuto  |e verfasserin  |4 aut 
773 0 8 |i Enthalten in  |t Journal of synchrotron radiation  |d 1994  |g 27(2020), Pt 5 vom: 01. Sept., Seite 1366-1371  |w (DE-627)NLM09824129X  |x 1600-5775  |7 nnas 
773 1 8 |g volume:27  |g year:2020  |g number:Pt 5  |g day:01  |g month:09  |g pages:1366-1371 
856 4 0 |u http://dx.doi.org/10.1107/S1600577520009868  |3 Volltext 
912 |a GBV_USEFLAG_A 
912 |a SYSFLAG_A 
912 |a GBV_NLM 
912 |a GBV_ILN_40 
912 |a GBV_ILN_350 
912 |a GBV_ILN_2005 
951 |a AR 
952 |d 27  |j 2020  |e Pt 5  |b 01  |c 09  |h 1366-1371