Direct non-destructive total reflection X-ray fluorescence elemental determinations in zirconium alloy samples
The development of a direct non-destructive synchrotron-radiation-based total reflection X-ray fluorescence (TXRF) analytical methodology for elemental determinations in zirconium alloy samples is reported for the first time. Discs, of diameter 30 mm and about 1.6 mm thickness, of the zirconium allo...
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Détails bibliographiques
| Publié dans: | Journal of synchrotron radiation. - 1994. - 27(2020), Pt 5 vom: 01. Sept., Seite 1253-1261
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| Auteur principal: |
Sanyal, Kaushik
(Auteur) |
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| Autres auteurs: |
Kanrar, Buddhadev,
Dhara, Sangita,
Sibilia, Mirta,
Sengupta, Arijit,
Karydas, Andreas Germanos,
Mishra, Nand Lal |
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| Format: | Article en ligne
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| Langue: | English |
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| Publié: |
2020
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| Accès à la collection: | Journal of synchrotron radiation
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| Sujets: | Journal Article
TXRF
Zircalloy
low- and high-Z elements
non-destructive analysis
synchrotron |
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