SpotSDC : Revealing the Silent Data Corruption Propagation in High-Performance Computing Systems

The trend of rapid technology scaling is expected to make the hardware of high-performance computing (HPC) systems more susceptible to computational errors due to random bit flips. Some bit flips may cause a program to crash or have a minimal effect on the output, but others may lead to silent data...

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Publié dans:IEEE transactions on visualization and computer graphics. - 1996. - 27(2021), 10 vom: 30. Okt., Seite 3938-3952
Auteur principal: Li, Zhimin (Auteur)
Autres auteurs: Menon, Harshitha, Maljovec, Dan, Livnat, Yarden, Liu, Shusen, Mohror, Kathryn, Bremer, Peer-Timo, Pascucci, Valerio
Format: Article en ligne
Langue:English
Publié: 2021
Accès à la collection:IEEE transactions on visualization and computer graphics
Sujets:Journal Article
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520 |a The trend of rapid technology scaling is expected to make the hardware of high-performance computing (HPC) systems more susceptible to computational errors due to random bit flips. Some bit flips may cause a program to crash or have a minimal effect on the output, but others may lead to silent data corruption (SDC), i.e., undetected yet significant output errors. Classical fault injection analysis methods employ uniform sampling of random bit flips during program execution to derive a statistical resiliency profile. However, summarizing such fault injection result with sufficient detail is difficult, and understanding the behavior of the fault-corrupted program is still a challenge. In this article, we introduce SpotSDC, a visualization system to facilitate the analysis of a program's resilience to SDC. SpotSDC provides multiple perspectives at various levels of detail of the impact on the output relative to where in the source code the flipped bit occurs, which bit is flipped, and when during the execution it happens. SpotSDC also enables users to study the code protection and provide new insights to understand the behavior of a fault-injected program. Based on lessons learned, we demonstrate how what we found can improve the fault injection campaign method 
650 4 |a Journal Article 
700 1 |a Menon, Harshitha  |e verfasserin  |4 aut 
700 1 |a Maljovec, Dan  |e verfasserin  |4 aut 
700 1 |a Livnat, Yarden  |e verfasserin  |4 aut 
700 1 |a Liu, Shusen  |e verfasserin  |4 aut 
700 1 |a Mohror, Kathryn  |e verfasserin  |4 aut 
700 1 |a Bremer, Peer-Timo  |e verfasserin  |4 aut 
700 1 |a Pascucci, Valerio  |e verfasserin  |4 aut 
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