Style de citation APA

Morgan, A. J., Quiney, H. M., Bajt, S., & Chapman, H. N. (2020). Ptychographic X-ray speckle tracking. Journal of applied crystallography, 53(Pt 3), 760. https://doi.org/10.1107/S1600576720005567

Style de citation Chicago

Morgan, Andrew J., Harry M. Quiney, Saša Bajt, et Henry N. Chapman. "Ptychographic X-ray Speckle Tracking." Journal of Applied Crystallography 53, no. Pt 3 (2020): 760. https://dx.doi.org/10.1107/S1600576720005567.

Style de citation MLA

Morgan, Andrew J., et al. "Ptychographic X-ray Speckle Tracking." Journal of Applied Crystallography, vol. 53, no. Pt 3, 2020, p. 760.