Residual Stress and Ferroelastic Domain Reorientation in Declamped {001} Pb(Zr0.3Ti0.7)O3 Films
Ferroelectric films are often constrained by their substrates and subject to scaling effects, including suppressed dielectric permittivity. In this work, the thickness dependence of intrinsic and extrinsic contributions to the dielectric properties was elucidated. A novel approach to quantitatively...
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Bibliographische Detailangaben
| Veröffentlicht in: | IEEE transactions on ultrasonics, ferroelectrics, and frequency control. - 1986. - 68(2021), 2 vom: 14. Feb., Seite 259-272
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| 1. Verfasser: |
Denis-Rotella, Lyndsey M
(VerfasserIn) |
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| Weitere Verfasser: |
Esteves, Giovanni,
Walker, Julian,
Zhou, Hanhan,
Jones, Jacob L,
Trolier-McKinstry, Susan |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2021
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| Zugriff auf das übergeordnete Werk: | IEEE transactions on ultrasonics, ferroelectrics, and frequency control
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| Schlagworte: | Journal Article |
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