Genome-Wide Mapping of Adult Plant Resistance to Leaf Rust and Stripe Rust in CIMMYT Wheat Line Arableu#1
Leaf (brown) rust (LR) and stripe (yellow) rust (YR), caused by Puccinia triticina and P. striiformis f. sp. tritici, respectively, significantly reduce wheat production worldwide. Disease-resistant wheat varieties offer farmers one of the most effective ways to manage these diseases. The common whe...
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Bibliographische Detailangaben
| Veröffentlicht in: | Plant disease. - 1997. - 104(2020), 5 vom: 02. Mai, Seite 1455-1464
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| 1. Verfasser: |
Yuan, Chan
(VerfasserIn) |
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| Weitere Verfasser: |
Singh, Ravi P,
Liu, Demei,
Randhawa, Mandeep S,
Huerta-Espino, Julio,
Lan, Caixia |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2020
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| Zugriff auf das übergeordnete Werk: | Plant disease
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| Schlagworte: | Journal Article
adult plant resistance
genome-wide mapping
leaf rust
quantitative trait loci
stripe rust
wheat
wheat rust |
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