The morphological changes of Nafion thin films with thicknesses from 10 to 200 nm on Pt substrate with various annealing histories (unannealed to 240 °C) were systematically investigated using grazing incidence small-angle X-ray scattering (GISAXS) and grazing incidence wide-angle X-ray scattering (...
Détails bibliographiques
| Publié dans: | Langmuir : the ACS journal of surfaces and colloids. - 1985. - 36(2020), 14 vom: 14. Apr., Seite 3871-3878
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| Auteur principal: |
Gao, Xiao
(Auteur) |
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| Autres auteurs: |
Yamamoto, Kentaro,
Hirai, Tomoyasu,
Uchiyama, Tomoki,
Ohta, Noboru,
Takao, Naoki,
Matsumoto, Masashi,
Imai, Hideto,
Sugawara, Seiho,
Shinohara, Kazuhiko,
Uchimoto, Yoshiharu |
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| Format: | Article en ligne
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| Langue: | English |
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| Publié: |
2020
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| Accès à la collection: | Langmuir : the ACS journal of surfaces and colloids
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| Sujets: | Journal Article |
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