Morphology Changes in Perfluorosulfonated Ionomer from Thickness and Thermal Treatment Conditions
The morphological changes of Nafion thin films with thicknesses from 10 to 200 nm on Pt substrate with various annealing histories (unannealed to 240 °C) were systematically investigated using grazing incidence small-angle X-ray scattering (GISAXS) and grazing incidence wide-angle X-ray scattering (...
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Bibliographische Detailangaben
| Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1985. - 36(2020), 14 vom: 14. Apr., Seite 3871-3878
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| 1. Verfasser: |
Gao, Xiao
(VerfasserIn) |
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| Weitere Verfasser: |
Yamamoto, Kentaro,
Hirai, Tomoyasu,
Uchiyama, Tomoki,
Ohta, Noboru,
Takao, Naoki,
Matsumoto, Masashi,
Imai, Hideto,
Sugawara, Seiho,
Shinohara, Kazuhiko,
Uchimoto, Yoshiharu |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2020
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| Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids
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| Schlagworte: | Journal Article |
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