Detecting and Removing Defects in Organosilane Self-Assembled Monolayers
Defects occur as self-assembled monolayers form, and the number and type of defects depend on the surface preparation and deposition solvent, among other parameters. Indirect measures to detect defects using a layer property, such as the thickness or bond vibrational frequency, are used routinely fo...
| Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1985. - 36(2020), 10 vom: 17. März, Seite 2563-2573 |
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| Format: | Online-Aufsatz |
| Sprache: | English |
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2020
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| Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids |
| Schlagworte: | Journal Article |
| Online verfügbar |
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