Effect of the Surfactant Charge and Concentration on the Change in the Forces between Two Charged Surfaces in Surfactant Solutions by a Liquid Flow
A combined atomic force microscope (AFM)-peristaltic pump system was used to determine the effect of a flow on the forces between two negatively charged surfaces (silica particle and silicon wafer) in aqueous solutions containing surfactants. The effect of the surfactant charge on the forces was det...
| Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1992. - 36(2020), 8 vom: 03. März, Seite 1887-1897 |
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| Format: | Online-Aufsatz |
| Sprache: | English |
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2020
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| Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids |
| Schlagworte: | Journal Article |
| Online verfügbar |
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