Parameter-free Gaussian PSF Model for Extended Depth of Field in Brightfield Microscopy

Due to their limited depth of field, conventional brightfield microscopes cannot image thick specimens entirely in focus. A common way to obtain an all-in-focus image is to acquire a z-stack of images by optically sectioning the specimen and then apply a multi-focus fusion method. Unfortunately, for...

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Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on image processing : a publication of the IEEE Signal Processing Society. - 1992. - (2019) vom: 11. Dez.
1. Verfasser: Zhou, Xu (VerfasserIn)
Weitere Verfasser: Molina, Rafael, Ma, Yi, Wang, Tianfu, Ni, Dong
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2019
Zugriff auf das übergeordnete Werk:IEEE transactions on image processing : a publication of the IEEE Signal Processing Society
Schlagworte:Journal Article