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231225s2019 xx |||||o 00| ||eng c |
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|a 10.1107/S1600577519012773
|2 doi
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|a pubmed24n1478.xml
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|a (NLM)31721745
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|a DE-627
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|e rakwb
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|a eng
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|a Medjanik, K
|e verfasserin
|4 aut
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|a Progress in HAXPES performance combining full-field k-imaging with time-of-flight recording
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|c 2019
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|a Text
|b txt
|2 rdacontent
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|a ƒaComputermedien
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|2 rdamedia
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|a ƒa Online-Ressource
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|2 rdacarrier
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|a Date Completed 18.11.2019
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|a Date Revised 22.07.2024
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|a published: Print-Electronic
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|a Citation Status PubMed-not-MEDLINE
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|a open access.
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|a An alternative approach to hard-X-ray photoelectron spectroscopy (HAXPES) has been established. The instrumental key feature is an increase of the dimensionality of the recording scheme from 2D to 3D. A high-energy momentum microscope detects electrons with initial kinetic energies up to 8 keV with a k-resolution of 0.025 Å-1, equivalent to an angular resolution of 0.034°. A special objective lens with k-space acceptance up to 25 Å-1 allows for simultaneous full-field imaging of many Brillouin zones. Combined with time-of-flight (ToF) parallel energy recording this yields maximum parallelization. Thanks to the high brilliance (1013 hν s-1 in a spot of <20 µm diameter) of beamline P22 at PETRA III (Hamburg, Germany), the microscope set a benchmark in HAXPES recording speed, i.e. several million counts per second for core-level signals and one million for d-bands of transition metals. The concept of tomographic k-space mapping established using soft X-rays works equally well in the hard X-ray range. Sharp valence band k-patterns of Re, collected at an excitation energy of 6 keV, correspond to direct transitions to the 28th repeated Brillouin zone. Measured total energy resolutions (photon bandwidth plus ToF-resolution) are 62 meV and 180 meV FWHM at 5.977 keV for monochromator crystals Si(333) and Si(311) and 450 meV at 4.0 keV for Si(111). Hard X-ray photoelectron diffraction (hXPD) patterns with rich fine structure are recorded within minutes. The short photoelectron wavelength (10% of the interatomic distance) `amplifies' phase differences, making full-field hXPD a sensitive structural tool
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|a Journal Article
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|a Brillouin zone
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|a HAXPES
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|a X-ray photoelectron diffraction
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|a k-space
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|a time-of-flight microscope
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|a Babenkov, S V
|e verfasserin
|4 aut
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|a Chernov, S
|e verfasserin
|4 aut
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|a Vasilyev, D
|e verfasserin
|4 aut
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|a Schönhense, B
|e verfasserin
|4 aut
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|a Schlueter, C
|e verfasserin
|4 aut
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|a Gloskovskii, A
|e verfasserin
|4 aut
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|a Matveyev, Yu
|e verfasserin
|4 aut
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|a Drube, W
|e verfasserin
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|a Elmers, H J
|e verfasserin
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|a Schönhense, G
|e verfasserin
|4 aut
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| 773 |
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|i Enthalten in
|t Journal of synchrotron radiation
|d 1994
|g 26(2019), Pt 6 vom: 01. Nov., Seite 1996-2012
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|x 1600-5775
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|g volume:26
|g year:2019
|g number:Pt 6
|g day:01
|g month:11
|g pages:1996-2012
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|u http://dx.doi.org/10.1107/S1600577519012773
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