QTL Mapping of Adult-Plant Resistance to Leaf and Stripe Rust in Wheat Cross SW 8588/Thatcher using the Wheat 55K SNP Array
Wheat leaf rust (caused by Puccinia triticina) and stripe rust (caused by Puccinia striiformis f. sp. tritici) cause large production losses in many regions of the world. The objective of this study was to identify quantitative trait loci (QTL) for resistance to leaf rust and stripe rust in a recomb...
Ausführliche Beschreibung
Bibliographische Detailangaben
| Veröffentlicht in: | Plant disease. - 1997. - 103(2019), 12 vom: 15. Dez., Seite 3041-3049
|
|---|
| 1. Verfasser: |
Zhang, Peipei
(VerfasserIn) |
|---|
| Weitere Verfasser: |
Li, Xing,
Gebrewahid, Takele-Weldu,
Liu, Hexing,
Xia, Xianchun,
He, Zhonghu,
Li, Zaifeng,
Liu, Daqun |
|---|
| Format: | Online-Aufsatz
|
|---|
| Sprache: | English |
|---|
| Veröffentlicht: |
2019
|
|---|
| Zugriff auf das übergeordnete Werk: | Plant disease
|
|---|
| Schlagworte: | Journal Article
cereals and grains
cultivar/resistance
disease management
field crops
fungi |
|---|