Jitter correction for transmission X-ray microscopy via measurement of geometric moments

Transmission X-ray microscopes (TXMs) have become one of the most powerful tools for imaging 3D structures of nano-scale samples using the computed tomography (CT) principle. As a major error source, sample jitter caused by mechanical instability of the rotation stage produces shifted 2D projections...

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Veröffentlicht in:	Journal of synchrotron radiation. - 1994. - 26(2019), Pt 5 vom: 01. Sept., Seite 1808-1814
1. Verfasser:	Wang, Shengxiang (VerfasserIn)
Weitere Verfasser:	Liu, Jianhong, Li, Yinghao, Chen, Jian, Guan, Yong, Zhu, Lei
Format:	Online-Aufsatz
Sprache:	English
Veröffentlicht:	2019
Zugriff auf das übergeordnete Werk:	Journal of synchrotron radiation
Schlagworte:	Journal Article TXM alignment geometric moment jitter correction motion artifact