Simultaneous scanning near-field optical and X-ray diffraction microscopy for correlative nanoscale structure-property characterization

A multimodal imaging instrument has been developed that integrates scanning near-field optical microscopy with nanofocused synchrotron X-ray diffraction imaging. The instrument allows for the simultaneous nanoscale characterization of electronic/near-field optical properties of materials together wi...

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Veröffentlicht in:	Journal of synchrotron radiation. - 1994. - 26(2019), Pt 5 vom: 01. Sept., Seite 1790-1796
1. Verfasser:	Li, Qian (VerfasserIn)
Weitere Verfasser:	Marks, Samuel D, Bean, Sunil, Fisher, Michael, Walko, Donald A, DiChiara, Anthony D, Chen, Xinzhong, Imura, Keiichiro, Sato, Noriaki K, Liu, Mengkun, Evans, Paul G, Wen, Haidan
Format:	Online-Aufsatz
Sprache:	English
Veröffentlicht:	2019
Zugriff auf das übergeordnete Werk:	Journal of synchrotron radiation
Schlagworte:	Journal Article X-ray diffraction imaging insulator–metal transitions multimodal imaging samarium sulfide scanning near-field optical microscopy scanning probe microscopy structure–property correlations