Grain Scattering Noise Modeling and Its Use in the Detection and Characterization of Defects Using Ultrasonic Arrays
In the field of ultrasonic array imaging for non-destructive testing (NDT), material structural noise caused by grain scattering is one of the main sources of error when characterizing defects that are found in the polycrystalline materials. The existence of grains can also severely affect the detec...
Ausführliche Beschreibung
Bibliographische Detailangaben
| Veröffentlicht in: | IEEE transactions on ultrasonics, ferroelectrics, and frequency control. - 1986. - 66(2019), 11 vom: 08. Nov., Seite 1798-1813
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| 1. Verfasser: |
Bai, Long
(VerfasserIn) |
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| Weitere Verfasser: |
Velichko, Alexander,
Drinkwater, Bruce W |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2019
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| Zugriff auf das übergeordnete Werk: | IEEE transactions on ultrasonics, ferroelectrics, and frequency control
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| Schlagworte: | Journal Article |
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