The covalent electron density, which makes Si(222) measurable, is subject to laser excitation. The three-wave Si(222)/(13 {\overline 1}) diffraction at 7.82 keV is used for phase measurements. It is found that laser excitation causes a relative phase change of around 4° in Si(222) in the first 100 p...
Bibliographische Detailangaben
| Veröffentlicht in: | Journal of synchrotron radiation. - 1994. - 26(2019), Pt 3 vom: 01. Mai, Seite 819-824
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| 1. Verfasser: |
Tsai, Yi Wei
(VerfasserIn) |
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| Weitere Verfasser: |
Chang, Ying Yi,
Lee, Jey Jau,
Liu, Wen Chung,
Wu, Yu Hsin,
Liu, Wei Rein,
Liu, Hsing Yu,
Lee, Kun Yuan,
Weng, Shih Chang,
Sheu, Hwo Shuenn,
Chiu, Mau Sen,
Lee, Yin Yu,
Hsu, Chia Hung,
Chang, Shih Lin |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2019
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| Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation
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| Schlagworte: | Journal Article
X-ray reflection phases
covalent electron density
laser excitation
pump–probe experiments
three-wave diffraction |
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